Testing

During the new product introduction phase, CE3 Electronics collaborates closely with our customers to understand their testing requirements and streamline the development and manufacturing process.

With our expertise in design testing, customers can move forward with confidence, minimizing risks while bringing their ideas to market swiftly and efficiently.

Customized Functional Test Solutions​

Understanding your requirements is key to robust testing solutions. PCB testing solutions can be developed to ensure that the final product will perform reliably in its intended environment, without failures or defects that could impact its function. Functional testing typically occurs after assembly and before the PCBA is shipped out or embedded into a final product.

Examples of deliverables for Functional Testing include:

  1. Fixture Machining and Assembly
  2. Test Program and Interface Board Development
  3. Gang or Sequential Programming as well as Serialization
  4. Connectivity Solutions for Data Collection and Quality Assurance
  5. Paperless Record Keeping of Test and Calibration Data

Flying Probe and In-Circuit Testing​

Flying Probe (FP) and In-Circuit Testing (ICT) are two methods of design-agnostic testing for fixtureless and bed-of-nail access methods. They take advantage of the recent technological developments in electronics testing. In contrast to functional testing, ICT can test up to 100% of discrete components and IC Interconnects.

CE3’s technical team can develop the test requirements, in collaboration with our customer, or develop turnkey solutions independently. Our in-house design team focusses on Design-for-Manufacturing (DFM) principles and follow strict signal integrity and HV isolation as well as ESD protection practices.

CE3’s FP and ICT equipment provide the following coverage:

  • High speed AMU for variable stimuli and measurement
  • Active guarding
  • Passive guarding
  • Vector-less testing
  • Functional testing
    • IC power up
    • Logic, truth table, IO pattern
    • Boundary scan
    • Timers/Counters
  • All-nets short detection
  • Device Programming
  • Test procedure debugging tools
  • Test coverage reports
  • Reporting of failures and statistical analysis